A near-field microwave microscope for determining anisotropic properties of dielectric materials

被引：0
|
作者：
D. A. Usanov
S. S. Gorbatov
V. Yu. Kvasko
A. V. Fadeev
机构：
[1] Saratov State University,
来源：
Instruments and Experimental Techniques | 2015年 / 58卷
关键词：
Resonance Frequency; Dielectric Surface; Dielectric Loss Tangent; Frequency Drift; Dielectric Permeability;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
A near-field microwave microscope based on the “inductive diaphragm-capacitive diaphragm” resonance system for contactless local determination of anisotropic properties of dielectric materials is presented. It is shown that the dielectric properties of microwave ceramic materials used as substrates for microwave circuits can be measured in directions parallel and normal to the working surface.
引用
收藏
页码：239 / 246
页数：7
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