A near-field microwave microscope for determining anisotropic properties of dielectric materials

被引：0
|
作者：
D. A. Usanov
S. S. Gorbatov
V. Yu. Kvasko
A. V. Fadeev
机构：
[1] Saratov State University,
来源：
Instruments and Experimental Techniques | 2015年 / 58卷
关键词：
Resonance Frequency; Dielectric Surface; Dielectric Loss Tangent; Frequency Drift; Dielectric Permeability;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
A near-field microwave microscope based on the “inductive diaphragm-capacitive diaphragm” resonance system for contactless local determination of anisotropic properties of dielectric materials is presented. It is shown that the dielectric properties of microwave ceramic materials used as substrates for microwave circuits can be measured in directions parallel and normal to the working surface.
引用
收藏
页码：239 / 246
页数：7
相关论文
共 50 条
  • [21] Dielectric properties characterization of saline solutions by near-field microwave microscopy
    Gu, Sijia
    Lin, Tianjun
    Lasri, Tuami
    MEASUREMENT SCIENCE AND TECHNOLOGY, 2017, 28 (01)
  • [22] Dielectric Director for Near-Field Microwave Imaging
    Bourqui, Jeremie
    Okoniewski, Michal
    Fear, Elise
    2009 3RD EUROPEAN CONFERENCE ON ANTENNAS AND PROPAGATION, VOLS 1-6, 2009, : 3211 - 3214
  • [23] Near-field measurements of dielectric properties of granular materials with microstrip antennas for microwave-sensing applications
    Trabelsi, S
    Nelson, SO
    RESEARCH IN NONDESTRUCTIVE EVALUATION, 2006, 17 (01) : 1 - 16
  • [24] Near-field microwave and embedded modulated scattering technique for dielectric characterization of materials
    Hughes, D
    Zoughi, R
    NONDESTRUCTIVE CHARACTERIZATION OF MATERIALS XI, 2003, : 331 - 337
  • [25] Scanning near-field dielectric microscopy at microwave frequencies for materials characterization.
    Stranick, SJ
    Buntin, SA
    Michaels, CA
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2003, 225 : U673 - U673
  • [26] Resonator probe for near-field scanning microwave microscope
    Gordienko, Yu. Ye
    Ryabukhin, A. A.
    Slipchenko, N. I.
    Ananyin, V. V.
    2005 15TH INTERNATIONAL CRIMEAN CONFERENCE MICROWAVE & TELECOMMUNICATION TECHNOLOGY, VOLS 1 AND 2, CONFERENCE PROCEEDINGS, 2005, : 721 - 722
  • [27] Graphene Etching by a Near-Field Scanning Microwave Microscope
    Monti, Tamara
    Di Donato, Andrea
    Mencarelli, Davide
    Venanzoni, Giuseppe
    Morini, Antonio
    Vlassiouk, Ivan V.
    Tselev, Alexander
    Farina, Marco
    2013 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST (IMS), 2013,
  • [28] Measurement of the dielectrics using the near-field microwave microscope
    Launets, VL
    Oliynik, VV
    14th International Crimean Conference: Microwave & Telecommunication Technology, Conference Proceedings, 2004, : 657 - 658
  • [29] Probing the local microwave properties of superconducting thin films by a scanning microwave near-field microscope
    Wu, LY
    Feng, YJ
    Wang, KL
    Jiang, T
    Kang, L
    Yang, SZ
    Wu, PH
    SUPERCONDUCTOR SCIENCE & TECHNOLOGY, 2002, 15 (12): : 1771 - 1774
  • [30] Microwave dielectric imaging of Ba2Ti9O20 materials with a scanning-tip microwave near-field microscope
    Chen, YC
    Cheng, HF
    Wang, G
    Xiang, XD
    Chiang, YC
    Liu, KS
    Lin, IN
    JOURNAL OF THE EUROPEAN CERAMIC SOCIETY, 2003, 23 (14) : 2671 - 2675
12345