PACS. 61.10.Kw X-ray reflectometry (surfaces, interfaces, films) - 68.35.Ct Interface structure and roughness - 68.55.Jk Structure and morphology; thickness;
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摘要:
The possibilities for calculating the X-ray or neutron scattering potential across a thin film from experimental specular reflectivity amplitude information alone and using full dynamical theory, i.e., phaseless inverse scattering, are investigated and compared with traditional fitting methods. The feasibility of the method is demonstrated by one trivial and two non-trivial experimental examples. The usefulness, but also the limitations are outlined by the experiments and by numerical examples. The data reduction is treated in some detail and, in particular, a new method is proposed for deconvolving the experimental data from the instrumental smearing function.
机构:
Southern Illinois Univ Edwardsville, Dept Math & Stat, Edwardsville, IL 62026 USASouthern Illinois Univ Edwardsville, Dept Math & Stat, Edwardsville, IL 62026 USA
Jiang, Yi
Liu, Jun
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Southern Illinois Univ Edwardsville, Dept Math & Stat, Edwardsville, IL 62026 USASouthern Illinois Univ Edwardsville, Dept Math & Stat, Edwardsville, IL 62026 USA
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Hong Kong Univ Sci & Technol, Dept Elect & Comp Engn, Hong Kong, Peoples R ChinaHong Kong Univ Sci & Technol, Dept Elect & Comp Engn, Hong Kong, Peoples R China
Wang, Wenjie
Murch, Ross
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Hong Kong Univ Sci & Technol, Dept Elect & Comp Engn, Hong Kong, Peoples R China
Hong Kong Univ Sci & Technol, Inst Adv Study, Hong Kong, Peoples R ChinaHong Kong Univ Sci & Technol, Dept Elect & Comp Engn, Hong Kong, Peoples R China