A laser system for the spectroscopy of highly charged bismuth ions

被引:0
|
作者
S. Albrecht
S. Altenburg
C. Siegel
N. Herschbach
G. Birkl
机构
[1] Technische Universität Darmstadt,Institut für Angewandte Physik
来源
Applied Physics B | 2012年 / 107卷
关键词
Tellurium; Laser System; Tuning Range; Free Spectral Range; Target Laser;
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学科分类号
摘要
We present and characterize a laser system for the spectroscopy on highly charged 209Bi82+ ions at a wavelength of 243.87 nm. For absolute frequency stabilization, the laser system is locked to a near-infra-red laser stabilized to a rubidium transition line using a transfer cavity based locking scheme. Tuning of the output frequency with high precision is achieved via a tunable rf offset lock. A sample-and-hold technique gives an extended tuning range of several THz in the UV. This scheme is universally applicable to the stabilization of laser systems at wavelengths not directly accessible to atomic or molecular resonances. We determine the frequency accuracy of the laser system using Doppler-free absorption spectroscopy of Te2 vapor at 488 nm. Scaled to the target wavelength of 244 nm, we achieve a frequency uncertainty of σ244 nm=6.14 MHz (one standard deviation) over six days of operation.
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页码:1069 / 1074
页数:5
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