A NHPP based software reliability model and optimal release policy with logistic-exponential test coverage under imperfect debugging

被引:32
|
作者
Chatterjee S. [1 ]
Singh J.B. [1 ]
机构
[1] Department of Applied Mathematics, ISM
来源
Chatterjee, S. (chaterjee_subhashis@rediffmail.com) | 1600年 / Springer卷 / 05期
关键词
Imperfect debugging; Logistic-exponential coverage function; Non-homogeneous Poisson process; Software reliability; Test coverage;
D O I
10.1007/s13198-013-0181-6
中图分类号
学科分类号
摘要
Software reliability models are used to estimate and predict the reliability, number of remaining faults, failure intensity, total software development cost, etc., of a software. Testing coverage is very important for both software developers and customers of software products. Testing converge is a measure that enables software developers to evaluate the quality of tested software and determine how much additional effort is needed to improve the reliability of the software. This paper proposes a software reliability growth model based on a non-homogeneous Poisson process (NHPP) that incorporates a logistic-exponential testing coverage function with imperfect debugging. The proposed model relates the test coverage to fault detection phenomena in debugging. Goodness-of-fit test of the proposed model is conducted using different criteria for two sets of software failure data. The proposed model is compared with other existing NHPP models. A software cost model incorporating testing coverage and an optimal release policy based on the number of remaining faults are developed. © 2013 The Society for Reliability Engineering, Quality and Operations Management (SREQOM), India and The Division of Operation and Maintenance, Lulea University of Technology, Sweden.
引用
收藏
页码:399 / 406
页数:7
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