X-ray photoelectron spectroscopy and near-edge X-ray-absorption fine structure of C60 polymer films

被引：0

作者：

M. Ramm

M. Ata

T. Gross

W. Unger

机构：

[1] Sony Corporation Frontier Science Laboratories,

[2] 2-1-1,undefined

[3] Shinsakuragaoka,undefined

[4] Hodogaya-ku,undefined

[5] Yokohama-shi 240-0036,undefined

[6] Japan (Fax: +81-45/353-6904,undefined

[7] E-mail: Matthias.Ramm@jp.sony.com),undefined

[8] Bundesanstalt für Materialforschung und -prüfung,undefined

[9] Unter den Eichen 44-46,undefined

[10] 12203 Berlin,undefined

[11] Germany,undefined

来源：

Applied Physics A | 2000年 / 70卷

关键词：

PACS: 73.61.Wp; 68.35.-p; 82.35.+t;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

We report core-level and valence-band X-ray photoelectron spectroscopy (XPS) and carbon []K near-edge X-ray-absorptionfine structure spectroscopy (NEXAFS) results of plasma-polymerized C60. In comparison with evaporated C60 the C 1s peak is broader and asymmetric for the C60 polymer and its shake-up satellites diminished. Furthermore, the features of the valence-band as well as the features of the π* antibonding orbitals of the C60 polymer are broader and reduced in intensity. Changes in the electronic structure are attributed to the polymerization of C60, the post-plasma functionalization of the surface by oxygen after exposure to atmosphere, and the occurrence of amorphous carbon.

引用

页码：387 / 390

页数：3