Structural, Transport, and Magnetic Properties of Ultrathin and Thin FeSi Films on Si(111)

被引:0
作者
Galkin, N. G. [1 ]
Chernev, I. M. [1 ]
Subbotin, E. Yu. [1 ]
Goroshko, O. A. [1 ]
Dotsenko, S. A. [1 ]
Maslov, A. M. [1 ]
Galkin, K. N. [1 ]
Kropachev, O. V. [1 ]
Goroshko, D. L. [1 ]
Samardak, A. Yu. [2 ]
Gerasimenko, A. V. [3 ]
Argunov, E. V. [4 ]
机构
[1] Russian Acad Sci, Inst Automat & Control Proc, Far East Branch, Vladivostok 690041, Russia
[2] Far Eastern Fed Univ, Inst High Technol & Adv Mat, Vladivostok 690922, Russia
[3] Russian Acad Sci, Inst Chem, Far East Branch, Vladivostok 690022, Russia
[4] Natl Res Technol Univ MISiS, Moscow 119049, Russia
来源
JOURNAL OF SURFACE INVESTIGATION | 2024年 / 18卷 / 02期
关键词
iron monosilicide; ultrathin films; crystal structure; conductivity; anomalous Hall effect; magnetic properties; solid-phase epitaxy; molecular-beam epitaxy; FERROMAGNETIC METAL TRANSITION; INDUCED LOCAL MOMENTS; SINGLET SEMICONDUCTOR; GAP FORMATION; TEMPERATURE; INSULATOR;
D O I
10.1134/S1027451024020265
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
Polycrystalline and epitaxial iron silicide (FeSi) films with thicknesses of 3.2-20.35 nm are grown on a Si(111) substrate using solid-phase and molecular-beam epitaxy at 350 degrees C, as confirmed by X-ray diffraction data. Morphological studies reveal that the films grown by solid-phase epitaxy are continuous and smooth with a root-mean-square roughness ranging from 0.4 to 1.1 nm, while those grown by molecular-beam epitaxy exhibit increased roughness and consist of coalesced grains with sizes up to 1 mu m and a pit density of up to 1 x 10(7) cm(-2). In the case of solid-phase epitaxy, an increase in the thickness leads to incomplete silicide formation and the emergence of a layer of disordered iron silicide with a thickness ranging from 10 to 20 nm, possibly with an excess of iron. This is confirmed by a change in the nature of the temperature dependence of the resistivity rho from semiconductor to semimetallic, which leads to a decrease in the resistivity by 1.5-2 times. The nonmonotonic character of the temperature dependence of the resistivity rho(T) for an ultrathin FeSi film with a thickness of 3.2 nm is identified, exhibiting a maximum around 230-240 K, a rising segment from 160 to 65 K with E-g = 14.8 meV, and further unsaturated growth down to 1.5 K. As the thickness of the FeSi films grown by molecular-beam epitaxy increases, the minimum and maximum are not observed, but the nonmonotonic trend of rho(T) with decreasing temperature and the opening of the band gap E-g = 23 meV are preserved. The possible reasons for the observed effects in the rho(T) dependences are considered. An anomalous Hall effect is detected in ultrathin and thin FeSi films grown by solid-phase and molecular-beam epitaxy, respectively, which confirms the weak ferromagnetic properties of the films. The results demonstrate the feasibility of growing and controlling the properties of ultrathin and thin FeSi films on silicon using methods of solid-phase and molecular-beam epitaxy, providing them with unique transport and magnetic properties not present in single crystals.
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页码:372 / 383
页数:12
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