Triple-crystal X-ray spectroscopy of diffuse scattering from tracks

被引：0
|
作者：
V. N. Peregudov
E. M. Pashaev
机构：
[1] Russian Academy of Sciences,Shubnikov Institute of Crystallography
来源：
Crystallography Reports | 2001年 / 46卷
关键词：
Spectroscopy; Theoretical Model; Computer Program; Charged Particle; Track Region;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
A theoretical model is presented for studying the structure of tracks of charged particles in crystals. Two structurally different track regions are considered: the track proper and its elastically deformed vicinity. A computer program is written for determining the contributions from a track and its elastically deformed vicinity to the experimental diffuse-scattering data and their quantitatively evaluating dimensions and other parameters. The effect of the model parameters on the shape of diffuse-scattering curves is also considered.
引用
收藏
页码：717 / 721
页数：4
相关论文
共 50 条
  • [1] Triple-crystal X-ray spectroscopy of diffuse scattering from tracks
    Peregudov, VN
    Pashaev, EM
    CRYSTALLOGRAPHY REPORTS, 2001, 46 (05) : 717 - 721
  • [2] Triple-crystal X-ray spectroscopy of diffuse scattering from tracks
    Peregudov, V.N.
    Pashaev, E.M.
    Kristallografiya, 2001, 46 (05): : 791 - 796
  • [3] Triple-crystal X-ray spectroscopy of diffuse scattering from tracks (vol 46, pg 717, 2001)
    Peregudov, VN
    Pashaev, ÉM
    CRYSTALLOGRAPHY REPORTS, 2002, 47 (04) : 705 - 705
  • [4] Erratum: “Triple-crystal X-ray spectroscopy of diffuse scattering from tracks” [Crystallogr. Rep. 46 (5) (2001), pp. 717–721]
    V. N. Peregudov
    É. M. Pashaev
    Crystallography Reports, 2002, 47 : 705 - 705
  • [5] RESOLUTION FUNCTION OF AN X-RAY TRIPLE-CRYSTAL DIFFRACTOMETER
    COWLEY, RA
    ACTA CRYSTALLOGRAPHICA SECTION A, 1987, 43 : 825 - 836
  • [6] REINFORCEMENT OF THE PSEUDOPEAK IN TRIPLE-CRYSTAL X-RAY-DIFFRACTION SPECTRA BY THERMAL DIFFUSE-SCATTERING
    KAZIMIROV, AY
    KOVALCHUK, MV
    KON, VG
    KRISTALLOGRAFIYA, 1987, 32 (06): : 1360 - 1364
  • [7] CURVED CRYSTAL ANALYSIS USING A TRIPLE-CRYSTAL X-RAY SPECTROMETER
    HAKIM, MB
    WOODGATE, BE
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1990, 51 (05): : 369 - 373
  • [8] X-ray triple-crystal diffractometry of defects in epitaxic layers
    Holy, V., 1600, Int Union of Crystallography, Copenhagen, Denmark (27):
  • [9] X-RAY TRIPLE-CRYSTAL DIFFRACTOMETRY OF DEFECTS IN EPITAXIAL LAYERS
    HOLY, V
    WOLF, K
    KASTNER, M
    STANZL, H
    GEBHARDT, W
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1994, 27 : 551 - 557
  • [10] The analytical description of diffuse peaks on profiles of triple-crystal X-ray diffractometry from single crystals with microdefects
    Shpak, AP
    Molodkin, VB
    Olikhovs'ky, SJ
    Kyslovs'ky, YM
    Reshetnyk, OV
    Vladimirova, TP
    Barabash, RI
    Grigoriev, DO
    METALLOFIZIKA I NOVEISHIE TEKHNOLOGII, 2005, 27 (09): : 1223 - 1236
12345