Erratum to: A study on the competition between bias-induced charge trapping and light-induced instability in In-Ga-Zn-O thin-film transistors

被引：0

作者：

Jozeph Park

Nguyen Dinh Trung

Yang Soo Kim

Jong Heon Kim

Kyung Park

Hyun-Suk Kim

机构：

[1] KAIST,Department of Materials Science and Engineering

[2] R&D Center,Department of Materials Science and Engineering

[3] Samsung Display,School of Integrated Technology

[4] Chungnam National University,undefined

[5] Yonsei University,undefined

来源：

Journal of Electroceramics | 2016年 / 36卷

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引用

页码：141 / 141