Author Correction: Highly accurate determination of heterogeneously stacked Van-der-Waals materials by optical microspectroscopy

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作者：
Andreas Hutzler
Birk Fritsch
Christian D. Matthus
Michael P. M. Jank
Mathias Rommel
机构：
[1] Friedrich-Alexander University Erlangen-Nürnberg,Electron Devices (LEB)
[2] Technische Universität Dresden,Circuit Design and Network Theory
[3] Fraunhofer Institute for Integrated Systems and Device Technology IISB,undefined
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Scientific Reports | / 13卷
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