Deformation characteristics of various grain boundary angles on AFM-based nanolithography using molecular dynamics

被引：0
作者：
Chan Il Kim
Seung Han Yang
Young Suk Kim
机构：
[1] Kyungpook National University,Institute of Mechanical Engineering Technology
[2] Kyungpook National University,Department of Mechanical Engineering
来源：
Journal of Mechanical Science and Technology | 2012年 / 26卷
关键词：
Molecular dynamics; Grain boundary; AFM-based nanolithography; Potential energy variation;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
Molecular dynamics simulations are performed to verify the deformation characteristics of grain boundaries on the AFM-based nanolithography. The model used has about 750,000 (Cu) atoms and is composed of two different crystal orientations. The grain boundaries are located in the center of model and have 45, 90, 135, and −135 degree angles in the xz-plane. The tool is made of rigid diamond-like carbon and is in the shape of the Berkovich indenter. The simulation has four different stages: relaxation, indentation, re-relaxation, and lithography. The simulation results reveal that the lithography deforms the grain boundary shape by the tool. The deformation of grain boundary’s angle proceeds to minimize the total potential energy of whole system. Consequently, the grain boundary angle is changed about 90 degrees.
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页码：1841 / 1847
页数：6
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