Current Situation and Prospect of Nanometrology and its Standardization in Indonesia

被引：0
作者：
Beni Adi Trisna
Ardi Rahman
Asep Ridwan Nugraha
Nur Tjahyo Eka Darmayanti
Jimmy Pusaka
机构：
[1] Research Centre for Metrology–LIPI (RCM–LIPI),
来源：
MAPAN | 2018年 / 33卷
关键词：
Nanometrology; Standardization; Nanotechnology;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
As one of the emerging technologies in Indonesia, nanotechnology requires comprehensive studies of supporting infrastructures as well as the regulation that will underpin the quality of nanoproducts or nanoservices. Nanometrology is one of the most important supporting infrastructures for development of nanotechnology. This article reviews the importance of nanometrology and its standardization within the context of nanotechnology development in Indonesia. Current situation of nanotechnology development, relevant standards availability, necessity for new standards, nanometrology development and future goals have been explained. This article contributes novel insights about nanotechnology and nanometrology developments and may help the regulation body to make the policy.
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页码：469 / 480
页数：11
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