A Study of the Surface Morphology of Microfiltration Membranes of the MFFK and MPS Brands by Atomic-Force- and Scanning-Electron Microscopy

被引：0
|
作者：
S. V. Kovalev
S. I. Lazarev
O. A. Kovaleva
机构：
[1] Tambov State Technical University,
来源：
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques | 2020年 / 14卷
关键词：
atomic-force microscopy; scanning-electron microscopy; surface; morphology; microfiltration membrane;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：696 / 705
页数：9
相关论文
共 50 条
  • [1] A Study of the Surface Morphology of Microfiltration Membranes of the MFFK and MPS Brands by Atomic-Force- and Scanning-Electron Microscopy
    Kovalev, S. V.
    Lazarev, S. I.
    Kovaleva, O. A.
    JOURNAL OF SURFACE INVESTIGATION, 2020, 14 (04): : 696 - 705
  • [2] Investigations of the surface morphology of electrodeposited Ag-In coatings by means of optical, scanning-electron and atomic-force microscopy
    Dobrovolska, Ts.
    Kowalik, R.
    Zabinski, P.
    Krastev, I.
    BULGARIAN CHEMICAL COMMUNICATIONS, 2008, 40 (03): : 254 - 260
  • [3] THE SURFACE-STRUCTURE AND MORPHOLOGY OF POLYVINYLIDENE FLUORIDE MICROFILTRATION MEMBRANES BY ATOMIC FORCE MICROSCOPY
    FRITZSCHE, AK
    AREVALO, AR
    MOORE, MD
    ELINGS, VB
    KJOLLER, K
    WU, CM
    JOURNAL OF MEMBRANE SCIENCE, 1992, 68 (1-2) : 65 - 78
  • [4] Magnesium oxide (110) surface morphology study with atomic force microscopy and scanning electron microscopy
    Giese, DR
    Lamelas, FJ
    Owen, HA
    Gajdardziska-Josifovska, M
    SCANNING, 1999, 21 (02) : 73 - 74
  • [5] Atomic force microscopy and scanning electron microscopy study of MgO(110) surface faceting
    Giese, DR
    Lamelas, FJ
    Owen, HA
    Plass, R
    Gajdardziska-Josifovska, H
    SURFACE SCIENCE, 2000, 457 (03) : 326 - 336
  • [6] Silicon surface morphology study by atomic force microscopy
    Gerasimova, O
    Boragno, C
    Borisov, S
    Valbusa, U
    PHYSICS OF LOW-DIMENSIONAL STRUCTURES, 2002, 9-10 : 35 - 41
  • [7] Quantitative study of surface morphology by atomic force microscopy
    Choi, Y
    Cho, NI
    Choe, JI
    INTERNATIONAL JOURNAL OF MODERN PHYSICS B, 2002, 16 (28-29): : 4395 - 4400
  • [8] Surface characterization of microstructures on glass by atomic force microscopy and analytical scanning electron microscopy
    Boeck, T
    Schmidt, K
    Gerlitzke, A
    Wilde, PM
    DEFECT RECOGNITION AND IMAGE PROCESSING IN SEMICONDUCTORS 1997, 1998, 160 : 221 - 224
  • [9] Details of surface features in aromatic polyamide reverse osmosis membranes characterized by scanning electron and atomic force microscopy
    Kwak, SY
    Jung, SG
    Yoon, YS
    Ihm, DW
    JOURNAL OF POLYMER SCIENCE PART B-POLYMER PHYSICS, 1999, 37 (13) : 1429 - 1440
  • [10] THE SURFACE-STRUCTURE AND MORPHOLOGY OF POLYACRYLONITRILE MEMBRANES BY ATOMIC-FORCE MICROSCOPY
    FRITZSCHE, AK
    AREVALO, AR
    MOORE, MD
    OHARA, C
    JOURNAL OF MEMBRANE SCIENCE, 1993, 81 (1-2) : 109 - 120
12345