A Study of the Surface Morphology of Microfiltration Membranes of the MFFK and MPS Brands by Atomic-Force- and Scanning-Electron Microscopy

被引：0

作者：

S. V. Kovalev

S. I. Lazarev

O. A. Kovaleva

机构：

[1] Tambov State Technical University,

来源：

Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques | 2020年 / 14卷

关键词：

atomic-force microscopy; scanning-electron microscopy; surface; morphology; microfiltration membrane;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

引用

页码：696 / 705

页数：9

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