Contribution of Lattice Defects to the Intensity of Quasi-Forbidden X-ray Reflections of Diamond: Comparison of X-Ray Topography and Infrared Spectroscopy Data

被引：0
作者：
A. A. Shiryaev
D. A. Zolotov
E. M. Suprun
I. G. Dyachkova
S. A. Ivakhnenko
V. E. Asadchikov
机构：
[1] Russian Academy of Sciences,Frumkin Institute of Physical Chemistry and Electrochemistry
[2] Russian Academy of Sciences,Institute of Geology of Ore Deposits, Petrography, Mineralogy, and Geochemistry
[3] Russian Academy of Sciences,Shubnikov Institute of Crystallography, FSRC Crystallography and Photonics
[4] National Academy of Sciences of Ukraine,Bakul Institute for Superhard Materials
来源：
JETP Letters | 2020年 / 111卷
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摘要：
New developments of application of X-ray topography in the quasi-forbidden (222) reflection from perfect crystals with diamond lattice to investigate defects are presented. The spatial distribution of intensities of (111) and (222) X-ray reflections is correlated with the distribution of point defects in synthetic diamonds of various types. It is shown that X-ray topography in the quasi-forbidden (222) reflection is a promising tool for investigation of weak stress fields in perfect crystals.
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页码：489 / 493
页数：4
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