Complete Fault Detection Tests of Length 2 for Logic Networks under Stuck-at Faults of Gates

被引：0
作者：
Popkov K.A. [1 ]
机构：
[1] Keldysh Institute of Applied Mathematics, Miusskaya pl. 4, Moscow
来源：
Journal of Applied and Industrial Mathematics | 2018年 / 12卷 / 2期
基金：
俄罗斯科学基金会;
关键词：
complete fault detection test; logic network; stuck-at fault;
D O I：
10.1134/S1990478918020102
中图分类号：
学科分类号：
摘要：
We consider the problem of the synthesis of the logic networks implementing Boolean functions of n variables and allowing short complete fault detection tests regarding arbitrary stuck-at faults at the outputs of gates. We prove that there exists a basis consisting of two Boolean functions of at most four variables in which we can implement each Boolean function by a network allowing such a test with length at most 2. © 2018, Pleiades Publishing, Ltd.
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收藏
页码：302 / 312
页数：10
相关论文
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