Linking stress-driven microstructural evolution in nanocrystalline aluminium with grain boundary doping of oxygen

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作者
Mo-Rigen He
Saritha K. Samudrala
Gyuseok Kim
Peter J. Felfer
Andrew J. Breen
Julie M. Cairney
Daniel S. Gianola
机构
[1] University of Pennsylvania,Department of Materials Science and Engineering
[2] Australian Centre for Microscopy and Microanalysis,Department of Materials
[3] School of Aerospace,undefined
[4] Mechanical and Mechatronic Engineering,undefined
[5] University of Sydney,undefined
[6] University of California Santa Barbara,undefined
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Nature Communications | / 7卷
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摘要
The large fraction of material residing at grain boundaries in nanocrystalline metals and alloys is responsible for their ultrahigh strength, but also undesirable microstructural instability under thermal and mechanical loads. However, the underlying mechanism of stress-driven microstructural evolution is still poorly understood and precludes rational alloy design. Here we combine quantitative in situ electron microscopy with three-dimensional atom-probe tomography to directly link the mechanics and kinetics of grain boundary migration in nanocrystalline Al films with the excess of O atoms at the boundaries. Site-specific nanoindentation leads to grain growth that is retarded by impurities, and enables quantification of the critical stress for the onset of grain boundary migration. Our results show that a critical excess of impurities is required to stabilize interfaces in nanocrystalline materials against mechanical driving forces, providing new insights to guide control of deformation mechanisms and tailoring of mechanical properties apart from grain size alone.
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