Sensitization and radiation hardening of the photostimulable X-ray storage phosphor CsBr:Eu2+

被引:1
作者
Graham A. Appleby
Joerg Zimmermann
Sabine Hesse
Oliver Karg
Heinz von Seggern
机构
[1] Darmstadt University of Technology,Electronic Materials Division, Institute of Materials Science
来源
Journal of Materials Science: Materials in Electronics | 2009年 / 20卷
关键词
Hole Center; Image Plate; Radiation Hardness; CsBr; Storage Phosphor;
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摘要
The X-ray storage phosphor CsBr:Eu2+ in form of needle image plates is believed to be a promising alternative to the granular BaFBr:Eu2+ with regard to PSL yield and spatial resolution. Unfortunately, CsBr:Eu2+ exhibits poor radiation hardness, which is caused by a migration of europium ions initiated by naturally existing defect centers like (Eu2+-VCs)-centers and X-ray generated MEu-centers. It will be shown that the formation of (Eu2+-O2−)-dipoles at the expense of (Eu2+-VCs)-dipoles, incorporated by thermal annealing in O2-containing and humid atmosphere, does not improve the radiation stability. There is, however, a strong improvement in the radiation hardness by codoping of CsBr:Eu2+ with lithium ions, which is accompanied by a complete suppression of the previously observed MEu-center formation.
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页码:54 / 58
页数:4
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