Nonlinear control techniques for an atomic force microscope system

被引:13
|
作者
Yongchun Fang
Matthew Feemster
Darren Dawson
Nader M. Jalili
机构
[1] Institute of Robotics and Automatic Information System,Weapons and System Engineering Department
[2] Nankai University,undefined
[3] Annapolis,undefined
[4] Clemson University,undefined
来源
Journal of Control Theory and Applications | 2005年 / 3卷 / 1期
关键词
Atomic force microscope; Actaptive control; Learning control; Lyapunov-based stability analysis;
D O I
10.1007/s11768-005-0066-6
中图分类号
学科分类号
摘要
Two nonlinear control techniques are proposed for an atomic force microscope system. Initially, a learning-based control algorithm is developed for the microcantilever-sample system that achieves asymptotic cantilever tip tracking for periodic trajectories.Specifically,the control approach utilizes a learning-based feedforward term to compensate for periodic dynamics and high-gain terms to account for non-periodic dynamics. An adaptive control algorithm is then developed to achieve asymptotic cantilever tip tracking for bounded tip trajectories despite uncertainty throughout the system parameters. Simulation results are provided to illustrate the efficacy and performance of the control strategies.
引用
收藏
页码:85 / 92
页数:7
相关论文
共 50 条
  • [31] Application of Instantaneous Cantilever Frequency Fluctuation in Atomic Force Microscope Control Loop
    Hsu, Z-C
    Chang, Peter, I
    2018 18TH INTERNATIONAL CONFERENCE ON CONTROL, AUTOMATION AND SYSTEMS (ICCAS), 2018, : 700 - 705
  • [32] Imaging the microstructure of copper with the atomic force microscope (AFM) and ultrasonic force microscope (UFM)
    Druffner, CJ
    Schumaker, EJ
    Murray, PT
    Sathish, S
    TESTING, RELIABILITY, AND APPLICATION OF MICRO- AND NANO-MATERIAL SYSTEMS, 2003, 5045 : 122 - 131
  • [33] Atomic force microscope in a contactless mode: Peculiarities of force interactions
    S. Sh. Rekhviashvili
    Technical Physics Letters, 2000, 26 : 517 - 519
  • [34] Atomic force microscope in a contactless mode: Peculiarities of force interactions
    Rekhviashvili, SS
    TECHNICAL PHYSICS LETTERS, 2000, 26 (06) : 517 - 519
  • [35] Force measurements with the atomic force microscope: Technique, interpretation and applications
    Butt, HJ
    Cappella, B
    Kappl, M
    SURFACE SCIENCE REPORTS, 2005, 59 (1-6) : 1 - 152
  • [36] Imaging of atomic orbitals with the Atomic Force Microscope - experiments and simulations
    Giessibl, FJ
    Bielefeldt, H
    Hembacher, S
    Mannhart, J
    ANNALEN DER PHYSIK, 2001, 10 (11-12) : 887 - 910
  • [37] STUDY ON ENERGY DISSIPATION IN THE DYNAMIC SYSTEM OF TAPPING MODE ATOMIC FORCE MICROSCOPE
    Liu G.
    Zeng Y.
    Liu J.
    Wei Z.
    Lixue Xuebao/Chinese Journal of Theoretical and Applied Mechanics, 2023, 55 (11): : 2599 - 2613
  • [38] J3SPM: An Open-Source Microcontroller-Powered Control System for Atomic Force Microscope
    SangHeon Lee
    International Journal of Precision Engineering and Manufacturing, 2020, 21 : 1755 - 1762
  • [39] Microcutting of polymethyl methecrylate by atomic force microscope
    Zhu, JJ
    Zuo, DW
    Gu, N
    Lu, ZH
    ADVANCES IN ABRASIVE PROCESSES, 2001, 202-2 : 321 - 324
  • [40] Mask CD measurements with an atomic force microscope
    Yoshida, Y
    Sasaki, S
    Abe, T
    Mohri, H
    Hayashi, N
    PHOTOMASK AND NEXT GENERATION LITHOGRAPHY MASK TECHNOLOGY XI, 2004, 5446 : 759 - 769