Robust partial fingerprint recognition using wavelet SIFT descriptors

被引:0
作者
Ashok Aravindan
S. M. Anzar
机构
[1] M.E.S. College of Engineering,Department of Electronics and Communication Engineering
[2] M.E.S. College of Engineering,Department of Applied Electronics and Instrumentation Engineering
来源
Pattern Analysis and Applications | 2017年 / 20卷
关键词
Fingerprint; Partial fingerprint; Ridge orientation; Minutiae; Scale-invariant feature transform (SIFT); Wavelet transform;
D O I
暂无
中图分类号
学科分类号
摘要
Even though there have been many advancements in the fingerprint identification, matching of the partial and overlapped fingerprints is yet to be resolved. This problem has drawn more attention with the evolution of small-sized scanners. The research attempts to resolve this issue whenever there are no core points available in the partial fingerprints. Moreover, the scaled or rotated versions of the image may also lead to poor matching performance. In order to overcome these challenges, a robust partial fingerprint matching method using the scale-invariant feature transform (SIFT) features of the wavelet decomposed image is proposed. The performance of the proposed method is compared with the baseline (minutiae) and the state-of-the-art (SIFT) techniques for partial fingerprint recognition. The method is experimented for different cropped levels (horizontal, vertical, diagonal, quadrant-wise random cuts and the region around a core point) of the image. Experimental studies with 100 subjects show that the proposed method improves recognition accuracy and reduces false acceptance rate (FAR) and false rejection rate (FRR) even for images with 75% occlusion.
引用
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页码:963 / 979
页数:16
相关论文
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