Improved microwave dielectric properties of Nd(Mg0.5Sn0.5)O3 ceramics with Ni2+ substituting

This study elucidates the microwave dielectric properties and microstructures of Nd(Mg0.5−xNixSn0.5)O3 ceramics with a view to their potential for microwave devices. The Nd(Mg0.5−xNixSn0.5)O3 ceramics were prepared by the conventional solid-state method with various sintering temperatures. The X-ray diffraction patterns of the Nd(Mg0.43Ni0.07Sn0.5)O3 ceramics revealed no significant variation of phase with sintering temperatures. A dielectric constant (\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$ \varepsilon_{r} $$\end{document}) of 19.3 and a quality factor (Q × f) of 93,400 GHz and a temperature coefficient of resonant frequency (\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$ \tau_{f} $$\end{document}) of −66 ppm/ °C were obtained for Nd(Mg0.43Ni0.07Sn0.5)O3 ceramics that were sintered at 1,550 °C for 4 h.