Direct tomography with chemical-bond contrast

被引：0

作者：

Huotari S. ^{[1
,2
]}

Pylkkänen T. ^{[1
,2
]}

Verbeni R. ^{[1
]}

Monaco G. ^{[1
]}

Hämäläinen K. ^{[2
]}

机构：

[1] European Synchrotron Radiation Facility, F-38043 Grenoble

[2] Department of Physics, University of Helsinki, FI-00014, Helsinki

来源：

Nature Materials | 2011年 / 10卷 / 7期

基金：

芬兰科学院;

关键词：

D O I：

10.1038/nmat3031

中图分类号：

学科分类号：

摘要：

Three-dimensional (3D) X-ray imaging methods have advanced tremendously during recent years. Traditional tomography uses absorption as the contrast mechanism, but for many purposes its sensitivity is limited. The introduction of diffraction, small-angle scattering, refraction, and phase contrasts has increased the sensitivity, especially in materials composed of light elements (for example, carbon and oxygen). X-ray spectroscopy, in principle, offers information on element composition and chemical environment. However, its application in 3D imaging over macroscopic length scales has not been possible for light elements. Here we introduce a new hard-X-ray spectroscopic tomography with a unique sensitivity to light elements. In this method, dark-field section images are obtained directly without any reconstruction algorithms. We apply the method to acquire the 3D structure and map the chemical bonding in selected samples relevant to materials science. The novel aspects make this technique a powerful new imaging tool, with an inherent access to the molecular-level chemical environment. © 2011 Macmillan Publishers Limited. All rights reserved.

引用

页码：489 / 493

页数：4

共 30 条

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