A new approach to understanding the mechanisms of diffraction imaging of dislocations in X-ray topography

被引:0
作者
E. V. Suvorov
I. A. Smirnova
机构
[1] Russian Academy of Sciences,Institute of Solid State Physics
来源
Technical Physics Letters | 2012年 / 38卷
关键词
Wave Field; Technical Physic Letter; Screw Dislocation; Direct Image; Diffraction Image;
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学科分类号
摘要
Regularities in the formation of diffraction imaging of dislocations are studied by numerical modeling and experimental section X-ray topography. The study of X-ray scattering by irregularities of the crystal lattice is of interest for several reasons. First, the contrast of defects is connected with the fundamental problem of development of a dynamic theory of X-ray scattering in real crystals. Second, knowledge of the special features of diffraction makes possible a qualitative and, in some cases, quantitative analysis of the X-ray diffraction contrast of defects in a crystal lattice (measurements of the deformation, determination of the sign and parameters of the Burgers vector, etc.).
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页码:991 / 994
页数:3
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