共 26 条
- [21] Extended SiC defects: Polarized light microscopy delineation and synchrotron white-beam X-ray topography ratification JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 2003, 42 (9AB): : L1077 - L1079
- [22] On advantages of X-ray schemes with orthogonal diffraction vectors for studying the structural state of ion-plasma coatings Technical Physics Letters, 2013, 39 : 536 - 539
- [23] Sequential structural characterization of layers in the GaN/AlN/SiC/Si(111) system by X-ray diffraction upon every growth stage Technical Physics Letters, 2013, 39 : 994 - 997
- [24] The structural state of epitaxial ZnO layers assessed by measuring the integral intensity of three- and two-beam X-ray diffraction Technical Physics Letters, 2014, 40 : 894 - 896
- [25] Synchrotron X-ray topography study of defects in indium antimonide P-I-N structures grown by metal organic vapour phase epitaxy Journal of Materials Science: Materials in Electronics, 2005, 16 : 449 - 453
- [26] Dislocation Substructure in the Cold-Rolled Ni-20 Mass Pct Cr Alloy Analyzed by X-ray Diffraction, Positron Annihilation Lifetime, and Transmission Electron Microscopy Metallurgical and Materials Transactions A, 2016, 47 : 6384 - 6393