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T-stress and crack path stability of DCDC specimens
被引:1
|作者:
Theo Fett
Dietrich Munz
机构:
[1] Forschungszentrum Karlsruhe,Institut für Materialforschung II
来源:
关键词:
Mechanical Engineer;
Civil Engineer;
Limit Case;
Crack Path;
Subcritical Crack Growth;
D O I:
暂无
中图分类号:
学科分类号:
摘要:
The T-stress term of DCDC specimens is computed using the Boundary Collocation procedure and limit case consideratons. This parameter allows to understand path stability as found in literature for subcritical crack growth in galss.
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页码:L165 / L170
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