Present status and prospects for Spin-Echo Small-Angle Neutron Scattering (SESANS) at PIK neutron source

被引:1
作者
Kraan W.H. [1 ]
Akselrod L.A. [2 ]
Chetverikov Y.O. [2 ]
Grigoriev S.V. [2 ,3 ]
Moskwin E.V. [2 ]
Piyadov V.V. [2 ]
Set K.T. [3 ]
Sumbatyan A.A. [2 ]
Velichko E.V. [2 ,3 ]
Zabenkin V.N. [2 ]
机构
[1] Retired from Delft University of Technology, Delft
[2] Petersburg Nuclear Physics Institute, National Research Center Kurchatov Institute, Gatchina, St. Petersburg
[3] Petersburg State University, St-Petersburg
来源
Kraan, W.H. | 1600年 / Izdatel'stvo Nauka卷 / 08期
基金
俄罗斯基础研究基金会;
关键词
Compilation and indexing terms; Copyright 2024 Elsevier Inc;
D O I
10.1134/S1027451014050310
中图分类号
学科分类号
摘要
We discuss the present status and the prospects of Spin-Echo Small-Angle Neutron Scattering (SESANS) against the background of the available expertise and the neutron source PIK at PNPI (Gatchina). Two options for SESANS instruments are reviewed: (1) monochromatic with π-flipping permalloy foils and (2) with adiabatic radio frequency spin flippers in a white beam, combined with time-of-flight data collection. A software tool for quantitative prediction of the technical properties of option (2) is developed. For both options, we show that a SESANS instrument which can compete with instruments elsewhere, is realistic. For option (2), we suggest a perspective of spin-echo-length range such that neutron interference experiments become feasible. © 2014, Pleiades Publishing, Ltd.
引用
收藏
页码:1035 / 1043
页数:8
相关论文
共 19 条
[1]  
Bouwman W.G., Kraan W.H., Rekveldt M.T., Phys. B, 268, (1999)
[2]  
Rekveldt M.T., Bouwman W.G., Kraan W.H., Uca O., Grigoriev S.V., Habicht K., Keller T., Lect. Notes Phys., 601, (2003)
[3]  
Rekveldt M.T., Kraan W.H., Plomp J., Nucl. Instrum. Methods Phys. Res. A, 550, (2005)
[4]  
Rekveldt M.T., Rev. Sci. Instrum., 76, (2005)
[5]  
Pynn R., Fitzsimmons M.R., Lee W.T., Shah V.R., Washington A.L., Stonaha P., Littrell K., J. Appl. Crystallogr., 41, (2008)
[6]  
Pynn R., Fitzsimmons M.R., Leeb W.T., Stonaha P., Shah V.R., Washington A.L., Kirby B.J., Majkrzak C.F., Maranville B.B., Physica B, 404, (2009)
[7]  
Plomp J., Haan V.O., Dalgleish R.M., Langridge S., van Well A.A., Thin Solid Films, 515, (2007)
[8]  
Chetverikov Y.O., Piyadov V.N., Axelrod L.A., Sumbatyan A.A., Grigoriev S.V., J. Surf. Invest.: X-ray, Synchrotron Neutron Tech., 5, (2011)
[9]  
Velichko E.V., Chetverikov Y.O., Axelrod L.A., Zabenkin V.N., Piyadov V.V., Sumbatyan A.A., Kraan W.H., Grigoriev S.V., J. Surf. Ivest.: X-Ray, Synchrotr. Neutron Tech., 7, (2013)
[10]  
Gahler R., Golub R., Habicht K., Keller T., Felber J., Physica B, 229, (1996)