Study of the ZnSxSe1–x@Al2O3 nanostructures by X-ray diffraction and EXAFS spectroscopy

被引:0
作者
A. I. Chukavin
R. G. Valeev
Ya. V. Zubavichus
A. L. Trigub
A. N. Beltyukov
机构
[1] Russian Academy of Sciences,Institute of Physics and Technology, Ural Branch
[2] National Research Center “Kurchatov Institute”,undefined
来源
Journal of Structural Chemistry | 2017年 / 58卷
关键词
ZnS; Se; nanostructures; EXAFS; X-ray diffraction; nanoporous anodic aluminium oxide; thermal evaporation;
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学科分类号
摘要
Nanocomposite systems based on ternary ZnSxSe1–x semiconductor compounds with different compositions (x = 0, 0.3, 0.5, 0.7, 1) in dielectric matrices of nanoporous anodic aluminium oxide (AAO) are synthesized by high vacuum thermal evaporation of a zinc sulfide and selenide powder mixture. The effect of the atomic concentration of solid solutions and the structural parameters of the AAO template matrix on the crystal structure of the synthesized nanocomposites and the local atomic environment of Zn and Se atoms is investigated.
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页码:1236 / 1244
页数:8
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