Measurement of optical nonlinearity by antiresonant ring interferometric nonlinear spectroscopic (ARINS) technique

被引:0
|
作者
B. Bhushan
机构
[1] Near B V College,Department of Physics, Birla Institute of Technology, Mesra, Patna Campus
来源
Optics and Spectroscopy | 2016年 / 121卷
关键词
D O I
暂无
中图分类号
学科分类号
摘要
We have reported the measurement of third-order optical nonlinearity by antiresonant ring interferometric nonlinear spectroscopic (ARINS) technique and discussed its usefulness over other popular measuring techniques such as Z-scan, degenerate four wave mixing (DFWM) and third harmonic generation (THG). The measurement has been simulated theoretically by taking different numerical values as well as sign of δ, which is a key parameter of ARINS. The technique has been benchmarked using toluene and the theoretical simulation has been substantiated experimentally by measuring the nonlinear optical coefficients (n2 and β) of two different samples. The disadvantages of the technique have also been discussed. However, a number of advantages of ARINS override its disadvantages and therefore, ARINS may be preferred over other measuring techniques for the measurement of nonlinear optical parameters.
引用
收藏
页码:276 / 282
页数:6
相关论文
共 50 条
  • [21] MEASUREMENT OF NONRESONANT 3RD-ORDER SUSCEPTIBILITIES OF VARIOUS GASES BY THE NONLINEAR INTERFEROMETRIC-TECHNIQUE
    HAHN, JW
    LEE, ES
    JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS, 1995, 12 (06) : 1021 - 1027
  • [22] Measurement of the nonlinear optical properties of semiconductors using the Irradiance Scan technique
    Gonzalez, Leonel P.
    Murray, Joel M.
    Cowan, Vincent M.
    Guha, Shekhar
    NONLINEAR FREQUENCY GENERATION AND CONVERSION: MATERIALS, DEVICES, AND APPLICATIONS VII, 2008, 6875
  • [23] Interferometric measurement of femtosecond pulse modulation via cascaded second-order nonlinear optical process
    Kim, CM
    Yoon, CS
    Kim, DH
    17TH CONGRESS OF THE INTERNATIONAL COMMISSION FOR OPTICS: OPTICS FOR SCIENCE AND NEW TECHNOLOGY, PTS 1 AND 2, 1996, 2778 : 783 - 784
  • [24] DIFFERENTIAL INTERFEROMETRIC-TECHNIQUE FOR THE MEASUREMENT OF THE NONLINEAR INDEX OF REFRACTION OF RUBY AND GDAIO3-CR-3+
    CATUNDA, T
    ANDREETA, JP
    CASTRO, JC
    APPLIED OPTICS, 1986, 25 (14): : 2391 - 2395
  • [25] A new measurement technique of optical fiber nonlinearity using the first dip frequency of fiber transfer function
    Morgado, JAP
    Cartaxo, AVT
    APPLICATIONS OF PHOTONIC TECHNOLOGY 3, 1998, 3491 : 812 - 817
  • [26] Optical scattering measurement of highly reflective coatings with the cavity ring-down technique
    Li, Bincheng
    Zhang, Xinyi
    Yang, Zhe
    Wang, Ding
    Han, Yanling
    Li, Tao
    Cui, Hao
    Zhao, Binxing
    OPTICS LETTERS, 2024, 49 (16) : 4601 - 4604
  • [27] TIME-RESOLVED ABSOLUTE INTERFEROMETRIC MEASUREMENT OF 3RD-ORDER NONLINEAR-OPTICAL SUSCEPTIBILITIES
    SARGER, L
    SEGONDS, P
    CANIONI, L
    ADAMIETZ, F
    DUCASSE, A
    DUCHESNE, C
    FARGIN, E
    OLAZCUAGA, R
    LEFLEM, G
    JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS, 1994, 11 (06) : 995 - 999
  • [28] NEW MEASUREMENT SYSTEM FOR FAULT LOCATION IN OPTICAL WAVE-GUIDE DEVICES BASED ON AN INTERFEROMETRIC-TECHNIQUE
    TAKADA, K
    YOKOHAMA, I
    CHIDA, K
    NODA, J
    APPLIED OPTICS, 1987, 26 (09) : 1603 - 1606
  • [29] Nonlinear optical characterization and measurement of optical limiting threshold of CdSe quantum dots prepared by a microemulsion technique
    Mathew, S.
    Saran, Amit D.
    Joseph, Santhi Ani
    Bhardwaj, Bishwajeet Singh
    Punj, Deep
    Radhakrishnan, P.
    Nampoori, V. P. N.
    Vallabhan, C. P. G.
    Bellare, Jayesh R.
    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2012, 23 (03) : 739 - 745
  • [30] Nonlinear optical characterization and measurement of optical limiting threshold of CdSe quantum dots prepared by a microemulsion technique
    S. Mathew
    Amit D. Saran
    Santhi Ani Joseph
    Bishwajeet Singh Bhardwaj
    Deep Punj
    P. Radhakrishnan
    V. P. N. Nampoori
    C. P. G. Vallabhan
    Jayesh R. Bellare
    Journal of Materials Science: Materials in Electronics, 2012, 23 : 739 - 745