Genome-wide association study reveals new loci for yield-related traits in Sichuan wheat germplasm under stripe rust stress

被引：0
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作者：
Xueling Ye
Jian Li
Yukun Cheng
Fangjie Yao
Li Long
Yuqi Wang
Yu Wu
Jing Li
Jirui Wang
Qiantao Jiang
Houyang Kang
Wei Li
Pengfei Qi
Xiujin Lan
Jian Ma
Yaxi Liu
Yunfeng Jiang
Yuming Wei
Xianming Chen
Chunji Liu
Youliang Zheng
Guoyue Chen
机构：
[1] Sichuan Agricultural University,Triticeae Research Institute
[2] Sichuan Agricultural University,College of Agronomy
[3] Washington State University,US Department of Agriculture, Agricultural Research Service, Wheat Health, Genetics and Quality Research Unit; and Department of Plant Pathology
[4] CSIRO Agriculture and Food,undefined
来源：
BMC Genomics | / 20卷
关键词：
Wheat; 55 K SNP; Genome-wide association study; Yield-related traits; Stripe rust;
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