Synthetic Semiconductor Diamond Electrodes: Comparison of Electrochemical Impedance at the Growth and Nucleation Surfaces of a Coarse-Grained Polycrystalline Film
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作者:
Yu. V. Pleskov
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机构:Russian Academy of Sciences,Frumkin Institute of Electrochemistry
Yu. V. Pleskov
M. D. Krotova
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机构:Russian Academy of Sciences,Frumkin Institute of Electrochemistry
M. D. Krotova
Yu. E. Evstefeeva
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机构:Russian Academy of Sciences,Frumkin Institute of Electrochemistry
Yu. E. Evstefeeva
V. G. Ral'chenko
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机构:Russian Academy of Sciences,Frumkin Institute of Electrochemistry
V. G. Ral'chenko
I. I. Vlasov
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机构:Russian Academy of Sciences,Frumkin Institute of Electrochemistry
I. I. Vlasov
A. V. Khomich
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机构:Russian Academy of Sciences,Frumkin Institute of Electrochemistry
A. V. Khomich
机构:
[1] Russian Academy of Sciences,Frumkin Institute of Electrochemistry
[2] Russian Academy of Sciences,Institute of General Physics
[3] Institute of Radio Engineering and Electronics,undefined
来源:
Russian Journal of Electrochemistry
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2001年
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37卷
关键词:
Physical Chemistry;
Crystal Structure;
Boron;
Film Growth;
Perfect Crystal;
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摘要:
A comparative study of the impedance of the growth and nucleation surfaces of a free-standing film of polycrystalline diamond deposited from RF-plasma and moderately doped with boron is performed. Using Mott–Schottky plots, the acceptor concentration is determined. It is shown that in the diamond bulk adjacent to the film growth side, which has more perfect crystal structure, this concentration is much lower than that near the nucleation side, where the film consists of submicron-sized grains.