Temperature dependence of the photocurrent in Ge1−xSnx layers

被引:1
作者
Sukill Kang
Yeon-Ho Kil
Tae Soo Jeong
Chel-Jong Choi
Kyu-Hwan Shim
Dae-Jung Kim
Yong-Dae Choi
Taek Sung Kim
机构
[1] Chonbuk National University,Semiconductor Physics Research Center, School of Semiconductor and Chemical Engineering, Institute of Photonics Electronics and Information, and Department of Physics
[2] Hanbat National University,School of Basic Sciences
[3] Mokwon University,Department of Microbial & Nano Materials
[4] Kunsan National University,Institute of Educational Development
来源
Journal of the Korean Physical Society | 2016年 / 69卷
关键词
Photocurrent; Bowing parameter; RTCVD; GeSn;
D O I
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中图分类号
学科分类号
摘要
The temperature dependence of the photocurrent in Ge1−xSnx layers was measured for different Sn compositions (0.00 ≤ x ≤ 0.83%). As the Sn composition in the Ge1−xSnx layer increased, the photocurrent peak was clearly red shifted in comparison with that of Ge. As the measurement temperature was increased, the photocurrent peak was also clearly red shifted. The measured temperature dependence of the energy band gap was nicely fitted by using Varshni’s empirical expression. Temperature-dependent bowing parameters were fitted for the equation relationship.
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页码:207 / 212
页数:5
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共 158 条
  • [1] Oehme M.(2013)undefined Opt. Expres 21 2206-undefined
  • [2] Gollhofer M.(2014)undefined J. Korean Phys. Soc. 64 98-undefined
  • [3] Widmann D.(2014)undefined J. Korean Phys. Soc. 64 1430-undefined
  • [4] Schmid M.(2013)undefined Appl. Phys. Lett. 102 182106-undefined
  • [5] Kaschel M.(2012)undefined Semicond. Sci. Technol. 27 094006-undefined
  • [6] Kasper E.(2012)undefined Thin Solid Films 520 3354-undefined
  • [7] Schulze J.(2014)undefined Appl. Phys. Lett. 105 151109-undefined
  • [8] Kil Y.-H.(2013)undefined J. Appl. Phys. 113 073707-undefined
  • [9] Yang J.-H.(2012)undefined J. Appl. Phys. 112 103715-undefined
  • [10] Khurelbaatar Z.(2013)undefined Appl. Phys. Lett. 103 041908-undefined