X-Ray fluorescence analysis of Ge–As–Se glasses using X-Ray and electron-beam excitation

被引：0
|
作者：
G. A. Bordovsky
A. V. Marchenko
P. P. Seregin
K. U. Bobokhuzhaev
机构：
[1] Gertsen State Pedagogical University,
[2] Ulugbek National University of Uzbekistan,undefined
来源：
Inorganic Materials | 2015年 / 51卷
关键词：
Arsenic; Selenium; Calibration Plot; Chalcogenide Glass; Glassy Alloy;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
The quantitative content of germanium, arsenic, and selenium in As1–xSex, Ge1–xSex, and Ge1–x–yAsySex (Asy(Ge1–zSez)1–y) glassy alloys has been determined by X-ray fluorescence analysis with fluorescence excitation by bremsstrahlung X-rays and an electron beam. The use of these techniques has made it possible to determine the quantitative composition of the glasses (x, y, and z) with an accuracy of ±0.0002 in a surface layer 0.1 mm (under X-ray excitation) to 0.1 μm (under electron beam excitation) in thickness.
引用
收藏
页码：939 / 943
页数：4
相关论文
共 50 条
  • [1] X-Ray fluorescence analysis of Ge-As-Se glasses using X-Ray and electron-beam excitation
    Bordovsky, G. A.
    Marchenko, A. V.
    Seregin, P. P.
    Bobokhuzhaev, K. U.
    INORGANIC MATERIALS, 2015, 51 (09) : 939 - 943
  • [2] X-ray fluorescence analysis of the composition of As-Ge-Se glasses and films
    Bordovskii, G. A.
    Gladkikh, P. V.
    Eremin, I. V.
    Marchenko, A. V.
    Seregin, P. P.
    Smirnova, N. N.
    Terukov, E. I.
    TECHNICAL PHYSICS LETTERS, 2011, 37 (03) : 250 - 252
  • [3] X-ray fluorescence analysis of the composition of As-Ge-Se glasses and films
    G. A. Bordovskii
    P. V. Gladkikh
    I. V. Eremin
    A. V. Marchenko
    P. P. Seregin
    N. N. Smirnova
    E. I. Terukov
    Technical Physics Letters, 2011, 37 : 250 - 252
  • [4] X-ray fluorescence analysis by multiple-glancing X-ray beam excitation
    Tsuji, K
    Sato, T
    Wagatsuma, K
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1998, 37 (10): : 5821 - 5822
  • [5] ACCURATE X-RAY DIAGNOSTICS OF ELECTRON-BEAM X-RAY SIMULATORS
    DOZIER, CM
    BROWN, DB
    CRISS, JW
    BIRKS, LS
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1978, 25 (06) : 1634 - 1639
  • [6] X-ray fluorescence analysis of chalcogenide glass with electron beam fluorescence excitation
    A. V. Marchenko
    K. U. Bobokhuzhaev
    A. V. Nikolaeva
    F. S. Nasredinov
    P. P. Seregin
    Glass Physics and Chemistry, 2015, 41 : 474 - 477
  • [7] X-ray fluorescence analysis of chalcogenide glass with electron beam fluorescence excitation
    Marchenko, A. V.
    Bobokhuzhaev, K. U.
    Nikolaeva, A. V.
    Nasredinov, F. S.
    Seregin, P. P.
    GLASS PHYSICS AND CHEMISTRY, 2015, 41 (05) : 474 - 477
  • [8] X-ray fluorescence analysis of Ge1-x Se x , As1-x Se x , and Ge1-x-y As y Se x glasses using electronic excitation
    Terukov, E. I.
    Seregin, P. P.
    Marchenko, A. V.
    Zhilina, D. V.
    Bobokhuzhaev, K. U.
    SEMICONDUCTORS, 2015, 49 (10) : 1352 - 1356
  • [9] X-ray mapping in electron-beam instruments
    Friel, JJ
    Lyman, CE
    MICROSCOPY AND MICROANALYSIS, 2006, 12 (01) : 2 - 25
  • [10] ELECTRON-BEAM AND X-RAY RESISTS FOR MICROLITHOGRAPHY
    ERANIAN, A
    BERNARD, F
    DUBOIS, JC
    MAKROMOLEKULARE CHEMIE-MACROMOLECULAR SYMPOSIA, 1989, 24 : 41 - 65
12345