Young’s modulus and tensile strength of CuNi(Mn) thin films on polyimide foils by tensile testing

被引:0
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作者
F. Macionczyk
W. Brückner
W. Pitschke
G. Reiss
机构
[1] Institute of Solid State and Materials Research Dresden,
来源
Journal of Materials Research | 1998年 / 13卷
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摘要
Force-strain curves were measured for 1.0 μm and 1.5 μm thick Cu0.57Ni0.42Mn0.01 films on 8 μm thick polyimide foils by tensile testing. By separating the force working on the polyimide foil from that working on the metal-polyimide compound, stress-strain curves for the CuNi(Mn) films were obtained. Young’s modulus and tensile strength were determined for as-deposited and annealed [350 °C, 1 h, N2/H2(5 vol%) atmosphere] films by this method. Crack propagation starts at the end of the elastic region at 0.2 to 0.7% strain, depending on the film thickness and the thermal treatment. The cracking behavior is described by a steady-state approximation.
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页码:2852 / 2858
页数:6
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