A high-throughput phenotyping procedure for evaluation of antixenosis against common cutworm at early seedling stage in soybean

被引：0
作者：
Guangnan Xing
Kai Liu
Junyi Gai
机构：
[1] Nanjing Agricultural University,Soybean Research Institute/National Center for Soybean Improvement/MOA Key Laboratory for Biology and Genetic Improvement of Soybean (General)/State Key Laboratory for Crop Genetics and Germplasm Enhancement/Jiangsu Collabor
来源：
Plant Methods | / 13卷
关键词：
Soybean; Common cutworm (CCW); High-throughput phenotyping; Antixenosis;
D O I：
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摘要：
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