Synthesis of easily-tested circuits in the case of single-type constant malfunctions at the element outputs

被引：5

作者：

Borodina Y.V. ^{[1
]}

机构：

[1] Department of Discrete Mathematics, Faculty of Mathematics and Mechanics, Moscow State University, Leninskie gory

来源：

Moscow University Computational Mathematics and Cybernetics | 2008年 / 32卷 / 1期

基金：

俄罗斯基础研究基金会;

关键词：

Boolean Function; Functional Element; Test Length; Disjunctive Normal Form; Circuit Input;

D O I：

10.3103/s11968-008-1006-5

中图分类号：

学科分类号：

摘要：

A method for the synthesis of easily-tested circuits consisting of functional elements in basis {&, ∨, -} for Boolean functions is proposed. The malfunctions are taken in the form of constant faults of the type "1" at the element outputs. It is proved that, for these circuits, the length of the complete checking test is not greater than 2. An example of the function that cannot be realized by means of a circuit admitting a shorter complete checking test is presented. © 2008 Allerton Press, Inc.

引用

页码：42 / 46

页数：4

共 7 条

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[7]

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