Wave effects in near-field microwave microscopy

被引：0
作者：
Reznik A.N. [1 ,2 ]
Galin M.A. [1 ]
机构：
[1] Institute for Physics of Microstructures, Russian Academy of Sciences, Nizhni Novgorod
[2] Lobachevsky State University of Nizhni Novgorod, Nizhni Novgorod
来源：
Bulletin of the Russian Academy of Sciences: Physics | 2014年 / 78卷 / 12期
基金：
俄罗斯基础研究基金会;
关键词：
Half Space; Wave Field; Wave Effect; Wave Resistance; Homogeneous Half Space;
D O I：
10.3103/S1062873814120387
中图分类号：
学科分类号：
摘要：
Probe impedance Z = R + iX of a near-field microwave microscope interacting with a plane-layered object is investigated within the context of electrodynamic (ED) and quasi-static (QS) theories. It is shown that the wave field of the probe considerably influences resistance R in the probing of weakly absorbing or resonating samples. This wave effect is taken into account in the ED theory but ignored in the QS theory. It is also shown that the action of the wave field results in a long-range effect that produces slower changes in function R(h) relative to X(h) with an increase in probe-object distance h. © 2014, Allerton Press, Inc.
引用
收藏
页码：1367 / 1373
页数：6
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