Averaged power spectrum density, fractal and multifractal spectra of Au nano-particles deposited onto annealed TiO2 thin films

被引：0
作者：
Shahram Solaymani
Ram Pratap Yadav
Ştefan Ţălu
Amine Achour
Sahar Rezaee
Negin Beryani Nezafat
机构：
[1] Islamic Azad University,Department of Physics, Kermanshah Branch
[2] Deen Dayal Upadhyay Govt. P.G. College,Physics Department
[3] Technical University of Cluj-Napoca,The Directorate of Research, Development and Innovation Management (DMCDI)
[4] University of Namur,Research Centre in Physics of Matter and Radiation (PMR), LISE Laboratory
[5] Institute for Research in Fundamental Sciences (IPM),School of Physics
来源：
Optical and Quantum Electronics | 2020年 / 52卷
关键词：
Gold nano particles; TiO; thin films; Multifractal analysis; Stereometric analysis; Atomic force microscopy;
D O I：
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摘要：
This work describes the morphology of titanium oxide (TiO2) thin films deposited by gold nanoparticles and produced at room temperature over Si(100) wafers. A direct-current (DC) reactive magnetron sputtering process was applied for the sample preparation. Then, their three-dimensional (3-D) surface characterization was carried out by using atomic force microscopy (AFM). Stereometric analysis was carrying out on the basis of AFM-data, and the surface topography was described according to ISO 25,178–2:2012 standard. As can be seen, the surface of sample #3 has the most regular topography (Df = 2.70 ± 0.01) with the most regular surface (Sq = 0.97 nm). The most irregular topography (Df = 2.83 ± 0.01) was found in sample #2, while the most irregular surface (Sq = 3.38 nm) was found in sample #1.
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