X-ray Diffraction Tomography Using Laboratory Sources for Studying Single Dislocations in a Low Absorbing Silicon Single Crystal

被引：0

作者：

D. A. Zolotov

V. E. Asadchikov

A. V. Buzmakov

I. G. D’yachkova

Yu. S. Krivonosov

F. N. Chukhovskii

E. V. Suvorov

机构：

[1] Russian Academy of Sciences,Shubnikov Institute of Crystallography, Crystallography and Photonics Federal Scientific Research Centre

[2] Lomonosov Moscow State University,Institute of Solid State Physics

[3] Russian Academy of Sciences,undefined

来源：

Optoelectronics, Instrumentation and Data Processing | 2019年 / 55卷

关键词：

X-ray topography; X-ray tomography; single dislocation half-loops; algebraic reconstruction techniques;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

This paper is a continuation of previous studies on the development of X-ray topo-tomography using laboratory equipment. The results on the spatial location of a single polygonal dislocation half-loop in a silicon single crystal were obtained as a result of testing the sensitivity of the X-ray topo-tomo diffractometer. A comparison was made with high-resolution experimental data obtained at the European synchrotron radiation facility (ESRF). The experimental procedure, software, and hardware for 3D reconstruction of the investigated single defect — a polygonal dislocation half-loop — are described.

引用

页码：126 / 132

页数：6

共 27 条

[1]

Baruchel J(2013)Synchrotron X-ray Imaging for Crystal Growth Studies C. R. Phys. 14 208-220

[2]

Di Michiel M(2012)X-ray Diffraction Topography in Physical Materials Science Kristallografiya 57 740-749

[3]

Lafford T(2001)Three-Dimensional Imaging of Crystal Defects by ‘Topo-Tomography’ J. Appl. Cryst. 34 602-607

[4]

Shul’pina I L(2012)Three-Dimensional Imaging of Dislocations by X-ray Diffraction Laminography Appl. Phys. Lett. 101 244103-600

[5]

Prokhorov I A(1975)Simulation des Trajets des Champs D’ondes Dans un Cristal Contenant une Dislocation Acta Cryst. A 591-373

[6]

Ludwig W(2014)Study of the Diffraction Contrast of Dislocations in X-ray Topo-Tomography: A Computer Simulation and Image Analysis Kristallografiya 59 365-16

[7]

Cloetens P(2017)The Possibility of Identifying the Spatial Location of Single Dislocations by Topo-Tomography on Laboratory Setups Kristallografiya 62 12-1622

[8]

Hartwig J(2018)X-ray Topo-Tomography Studies of Linear Crystals in Silicon Single Crystals J. Appl. Cryst. 51 1616-198

[9]

Hänschke D(1971)X-ray Diffraction Contrast and Geometry of Dislocation Half-Loops in Silicon Kristallografiya 16 190-25147

[10]

Helfen L(2016)Fast and Flexible X-ray Tomography using the ASTRA Toolbox Opt. Express. 24 25129-undefined

← 1 2 3 →