Shape measurement by carrier modulation in electronic speckle pattern interferometry

被引：0
作者：
Sun P. [1 ]
Huang Z.-X. [1 ]
Liu F. [1 ]
机构：
[1] College of Physics and Electronics, Shandong Normal University
来源：
Optoelectronics Letters | 2008年 / 4卷 / 3期
关键词：
TN247;
D O I：
10.1007/s11801-008-7127-2
中图分类号：
学科分类号：
摘要：
A shape measurement based on ESPI by using carrier is presented. When the tested object is tilted with a small angle, the carrier pattern containing altitude information is formed on the object surface. By using the carrier pattern captured by a CCD camera, the phase of the object can be derived by Fourier transform and the shape measurement is realized. The principle of the method is introduced and proved by an experiment. © 2008 Tianjin University of Technology and Springer-Verlag GmbH.
引用
收藏
页码：223 / 226
页数：3
相关论文
共 15 条
[1]  
Takeda T., Mutoh K., Appl. Opt., 22, (1983)
[2]  
Li J., Su X.Y., Gao L.R., Opt. Eng., 29, (1990)
[3]  
Spagnolo G.S., Guattari G., Sapia C., Opt. Laser Engng., 33, (2000)
[4]  
He X., Zou D., Liu S., Opt. Eng., 37, (1998)
[5]  
Su X.Y., Von Bally G., Vukieevic D., Opt. Commun., 98, (1993)
[6]  
Srinivasan V., Liu H.C., Halioua M., Appl. Opt., 23, (1984)
[7]  
Sun Y.C., Ge B.Z., Zhang Y.M., Journal of Optoelectronics Laser, 15, (2004)
[8]  
Sun P., Zhang L., Tao C.X., Acta Photonica Sinica, 34, (2005)
[9]  
Jin G.C., Chen W., Bao N.K., J Tsinghua Univ (Sci & Tech), 41, (2001)
[10]  
Si S.C., Wang Y.S., Yu F.S., Journal of Optoelectronics Laser, 12, (2001)
12