Room-temperature indentation creep of lead-free Sn–Bi solder alloys

被引:0
作者
R. Mahmudi
A. R. Geranmayeh
S. R. Mahmoodi
A. Khalatbari
机构
[1] University of Tehran,School of Metallurgical and Materials Engineering
[2] Islamic Azad University,Department of Mechanical Engineering
[3] South Tehran Branch,undefined
来源
Journal of Materials Science: Materials in Electronics | 2007年 / 18卷
关键词
Creep Rate; Solder Alloy; Creep Behavior; Stress Exponent; Indentation Creep;
D O I
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中图分类号
学科分类号
摘要
Creep behavior of the lead-free Sn–Bi alloys with bismuth contents in the range of 1–5 wt.% was studied by long time Vickers indentation testing at room temperature. The materials were examined in the homogenized cast and wrought conditions. The stress exponents, determined through different indentation methods, were in good agreement. The exponents of 13.4–15.3 and 9.2–10.0, found respectively for the cast and wrought conditions, are close to those determined by room-temperature conventional creep testing of the same material reported in the literature. Due to the solid solution hardening effects of Bi in Sn, creep rate decreased and creep resistance increased with increasing Bi content of the materials. Cast alloys, with a rather coarser grain structure and some Bi particles at the grain boundaries, showed typically higher resistance to indentation creep compared to the wrought materials. These two factors have apparently resulted in a less tendency of the material for grain boundary accommodated deformation, which is considered as a process to decrease the creep resistance of soft materials.
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页码:1071 / 1078
页数:7
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