Differential inverse inelastic mean free path determination on the base of X-ray photoelectron emission spectra

被引：2
|
作者：
Afanas’ev V.P. [1 ]
Gryazev A.S. [1 ]
Efremenko D.S. [1 ]
Kaplya P.S. [1 ]
Lyapunov N.V. [1 ]
机构：
[1] National Research University “Moscow Power Engineering Institute”, Moscow
来源：
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques | 2016年 / 10卷 / 5期
关键词：
Backward Differential Formula (BDF); cross section for inelastic energy losses; EELS; Electron Energy Loss Spectroscopy; ionization; method of invariant imbedding; multiple scattering; PES; plasma oscillations; X-ray photoelectron spectroscopy; XPS;
D O I：
10.1134/S1027451016050037
中图分类号：
学科分类号：
摘要：
The photoelectron spectroscopy model is based on the solution of the radiative transfer equation with inner sources. The exact numerical solutions using BDF method are presented. PES, XAES and EELS spectra are described as series by the number of inelastic scatterings. Differential inverse inelastic mean free path for Be and W are obtained from the experimental data by the fitting procedure. © 2016, Pleiades Publishing, Ltd.
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收藏
页码：906 / 911
页数：5
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