Reflected electron-energy-loss spectra, differential inverse inelastic mean free paths, and angular resolved X-ray photoelectron spectra of a niobium sample

被引：2

作者：

Afanas’ev V.P. ^{[1
]}

Gryazev A.S. ^{[1
]}

Kaplya P.S. ^{[1
]}

Andreyeva Y.O. ^{[1
]}

Golovina O.Y. ^{[1
]}

机构：

[1] National Research University “Moscow Power Engineering Institute”, st. Krasnokazarmennaya 14, Moscow

来源：

Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques | 2016年 / 10卷 / 1期

关键词：

differential inverse inelastic mean free path; elastic electron scattering; inelastic electron scattering; PES; REELS; XPS;

D O I：

10.1134/S1027451015060245

中图分类号：

学科分类号：

摘要：

A technique for recovering the differential inverse inelastic mean free paths (DIIMFP) of electrons in Nb from the reflected electron energy loss spectra (REELS) at initial energies of 5 to 40 keV using a threelayer model of the sample surface is presented. The recovered DIIMFP are used for analyzing X-ray photoelectron spectra measured at different viewing angles. Comparison with experimental data is carried out. © 2016, Pleiades Publishing, Ltd.

引用

页码：101 / 107

页数：6

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