RFID-based colored Petri net applied for quality monitoring in manufacturing system

被引：0
作者：
Yaqiong Lv
C. K. M. Lee
H. K. Chan
W. H. Ip
机构：
[1] Nanyang Technological University,Mechanical and Aerospace Engineering
[2] University of East Anglia,Norwich Business School
[3] The Hong Kong Polytechnic University,Department of Industrial and Systems Engineering
来源：
The International Journal of Advanced Manufacturing Technology | 2012年 / 60卷
关键词：
RFID; Colored Petri net modeling; Manufacturing process; Product quality monitoring; Process quality control; Real-time analysis;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
Product quality is difficult to be traced and monitored in the distributed manufacturing network. This paper proposes and develops a new RFID-based CPN modeling method where the colored tokens are evolved to color-tagged tokens carrying the product information of real-time status. With this new real-time modeling method, the performance of manufacturing systems such as yield rate and throughput can be realized. In this paper, a case study has been conducted to examine the feasibility and effectiveness of the proposed method. The simulation results show that the new modeling method is able to complete the preliminary real-time quality status analysis of a manufacturing system so as to handle dynamic and stochastic manufacturing network effectively and enable decision making for process improvement.
引用
收藏
页码：225 / 236
页数：11
相关论文
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