Determining the porosity of synthetic opals and porous silicon by x-ray methods

被引：0
|
作者：
V. V. Ratnikov
机构：
[1] Russian Academy of Sciences,A. I. Ioffe Physico
来源：
Physics of the Solid State | 1997年 / 39卷
关键词：
Spectroscopy; Silicon; Porosity; State Physics; Porous Silicon;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
A simple method is proposed for determining the porosity of fractal materials by measuring the absorption of x rays as they pass through these samples. The method makes it possible to measure the integrated porosity of objects rapidly, does not require special preparation of the objects, is not contaminating, and does not destroy their structure. The possibilities of this method are demonstrated for the examples of synthetic opals and porous silicon.
引用
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页码：856 / 858
页数：2
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