Estimation of tunneling-barrier width in scanning tunneling microscope from noise characteristics

被引：0
|
作者：
Bychikhin S.A.
Potemkin V.V.
Stepanov A.V.
机构：
来源：
Measurement Techniques | 1999年 / 42卷 / 12期
关键词：
Scanning Tunneling Microscope; Tunneling Junction; Tunneling Current; Flicker Noise; Barrier Width;
D O I：
10.1007/BF02512115
中图分类号：
学科分类号：
摘要：
A method is proposed for estimation of the potential-barrier width of the tunneling junction of a scanning tunneling microscope (STM). The method is based on measurement of the fluctuations of the tunneling-barrier height and their correlation with the flicker noise of the tunneling current. Measurements with the STM feedback enabled and disabled are considered. Experimental results are presented for a tunneling junction formed by a platinum-iridium tip and a graphite specimen. The principal sources of experimental error are examined.
引用
收藏
页码：1187 / 1192
页数：5
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