QTL for spike-layer uniformity and their influence on yield-related traits in wheat

被引：0

作者：

Chunhua Zhao

Na Zhang

Yongzhen Wu

Han Sun

Cheng Liu

Xiaoli Fan

Xuemei Yan

Hongxing Xu

Jun Ji

Fa Cui

机构：

[1] Ludong University,College of Agriculture

[2] Chinese Academy of Sciences,Center for Agricultural Resources Research, Institute of Genetics and Developmental Biology

[3] Shandong Academy of Agricultural Sciences,Crop Research Institute

[4] Chinese Academy of Sciences,Chengdu Institute of Biology

[5] Anqiu Municipal Burean of Agriculture,Institute of Plant Stress Biology, State Key Laboratory of Cotton Biology, Department of Biology

[6] Henan University,undefined

来源：

BMC Genetics | / 20卷

关键词：

Quantitative trait locus; Recombinant inbred line; Spike-layer uniformity; Wheat; Yield;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

引用

共 435 条

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