Identification and validation of quantitative trait loci conferring tan spot resistance in the bread wheat variety Ernie

被引：0
作者：
H. B. Li
W. Yan
G. R. Liu
S. M. Wen
C. J. Liu
机构：
[1] CSIRO Plant Industry,Institute of Food Crops
[2] Jiangsu Academy of Agricultural Science,Faculty of Agriculture
[3] Hebei Agricultural University,undefined
来源：
Theoretical and Applied Genetics | 2011年 / 122卷
关键词：
Quantitative Trait Locus; Plant Height; Doubled Haploid; Quantitative Trait Locus Analysis; Doubled Haploid Line;
D O I：
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中图分类号：
学科分类号：
摘要：
Tan spot, caused by Pyrenophora tritici-repentis, is a foliar disease of wheat, and it can inflict serious reduction in grain yield and quality. The bread wheat variety Ernie was found to be immune to this disease in Australia, and its genetic control was investigated by quantitative trait loci (QTL) analysis using a doubled haploid population. Eight QTL were identified in this population from three independent trials, and four of them were derived from the parent Ernie. The most significant QTL was located on chromosome arm 2BS, explaining 38.2, 29.8 and 36.2% of the phenotypic variance, respectively, in these trials. The effects of the 2BS QTL were further validated in four additional populations. The presence of this single QTL reduced disease severity by between 29.2 and 67.1% with an average of 50.5%. The significant effects of this QTL and its consistent detection across all the trials with different genetic backgrounds make it an ideal target for breeding programmes as well as for its further characterization. Data from this study also showed that neither plant height nor heading date significantly affects tan spot resistance.
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页码：395 / 403
页数：8
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