The effect of sulfur concentration on the properties of chemical bath deposited CdS thin films

被引:1
作者
Kodigala Subba Ramaiah
Anil Kumar Bhatnagar
R. D. Pilkington
A. E. Hill
R. D. Tomlinson
机构
[1] University of Hyderabad,School of Physics
[2] University of Hyderabad,School of Physics
[3] University of Salford,Department of Electronics and Electrical Engineering and Department of Physics
来源
Journal of Materials Science: Materials in Electronics | 2000年 / 11卷
关键词
Sulfide; Cadmium; Hexagonal; Sulfur Concentration; Hexagonal Structure;
D O I
暂无
中图分类号
学科分类号
摘要
We study the structural, surface morphology and optical properties of chemical bath deposited (CBD) cadmium sulfide (CdS) thin films under the effect of variation of S/Cd ratio. CdS thin films have been successfully deposited by CBD technique with solutions containing S/Cd ionic concentration ratio of 5.0, 2.5, 1.0, 0.5 and 0.25. Single phase CdS, with a hexagonal structure, is observed for the concentration of S/Cd = 5.0, 2.5, 1.0 and 0.5 films while for the ratio of 0.25, the films exhibited a partially amorphous nature. These have been confirmed by X-ray diffraction (XRD), transmission and scanning electron microscopy (TEM and SEM) analyses. The band gaps of the films obtained by transmission and photoacoustic spectra are found to be in the range of 2.40 to 3.26 eV. The large variation of band gaps of the films with composition is discussed by employing quantum size effect phenomena. The transition levels of CdS are also studied using photoacoustic spectroscopy.
引用
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页码:269 / 277
页数:8
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