Modification of polycrystalline SnO2 and ZnO under the action of a high-power ion beam of nanosecond duration

被引：0

作者：

Kovivchak V.S. ^{[1
]}

Panova T.V. ^{[1
]}

Krivozubov O.V. ^{[1
]}

Leontieva N.N. ^{[2
]}

Knyazev E.V. ^{[1
]}

机构：

[1] Dostoevsky Omsk State University, Omsk

[2] Institute of Hydrocarbon Processing, Siberian Branch, Russian Academy of Sciences, Omsk

来源：

Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques | 2014年 / 8卷 / 2期

关键词：

Neutron Technique; Energy Dispersive Analysis; Synchrotron Neutron Tech; Crystallographic Facet; Coherent Scattering Domain;

D O I：

10.1134/S1027451014020359

中图分类号：

学科分类号：

摘要：

The modification of polycrystalline oxides (SnO2 and ZnO) under the action of a nanosecond high-power ion beam (HPIB) with current densities of 50-150 A/cm2, which is accompanied by melting of initial particles of the surface layer, is investigated. It is established that submicron-sized particles of tetragonal SnO whose average size is 210 nm are formed on the SnO2 surface irradiated by an ion beam with a current density of 150 A/cm2. These particles have pronounced crystallographic faceting. When ZnO is irradiated by HPIBs with different current densities, a thin Zn film is formed in the sintered surface layer. Possible mechanisms of the observed conversions are discussed. © 2014 Pleiades Publishing, Ltd.

引用

页码：351 / 355

页数：4

共 11 条

[1]

Kovivchak V.S., Panova T.V., Gering G.I., J. Surf. Invest.: X-Ray, Synchrotron Neutron Tech., 1, (2007)

[2]

Romanov I.G., Tsareva I.N., Tech. Phys. Lett., 27, (2001)

[3]

Bolotov V.V., Kovivchak V.S., Korepanov A.A., Knyazev E.V., Nesov S.N., Roslikov V.E., Sten'kin Y.A., Korusenko P.M., Shelyagin R.V., J. Surf. Invest.: X-Ray, Synchrotron Neutron Tech., 5, (2011)

[4]

Colin R., Drowart J., Verhaegen G., Trans. Faraday Soc., 61, (1965)

[5]

Goldstein J.I., Newbury D.E., Echlin P., Et al., Scanning Electron Microscopy and X-Ray Microanalysis, (2003)

[6]

Alov N.V., Kutsko D.M., J. Surf. Invest.: X-Ray, Synchrotron Neutron Tech., 5, (2011)

[7]

Reid S.A., Ho W., Lamelas F.J., J. Phys. Chem. B, 104, (2000)

[8]

Meissel L., Glang R., Handbook of Thin Film Technology, (1970)

[9]

Jadraque M., Domingo C., Martin M., J. Appl. Phys., 104, (2008)

[10]

Lidin R.A., Molochko V.A., Andreeva L.L., Chemical Properties of Inorganic Substances, (2003)

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