Self-assembly of amorphous silicon island systems due to field-induced selectivity

被引:0
|
作者
Yu. A. Kosminska
A. A. Mokrenko
V. I. Perekrestov
机构
[1] Sumy State University,
来源
Technical Physics Letters | 2011年 / 37卷
关键词
Technical Physic Letter; Growth Surface; Hollow Cathode; Scanning Electron Microscopy Data; Erosion Zone;
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暂无
中图分类号
学科分类号
摘要
The structure and morphology characteristics of the surface of amorphous silicon (a-Si) condensates have been studied by the method of scanning electron microscopy (SEM). The SEM data revealed self-organization processes that lead to the formation of a-Si islands with similar shapes and sizes. A mathematical model is developed that partly explains the observed self-organization of island systems under the conditions of ultimately low supersaturations in the presence of an electric field at the growth surface and the deposition of ionized substance.
引用
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页码:538 / 540
页数:2
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