Scanning Synchrotron X-Ray Fluorescence Microanalysis for Tephrochronological Studies

被引：0
作者：
A. V. Darin
F. A. Darin
D. S. Sorokoletov
Ya. V. Rakshun
D. Yu. Rogozin
机构：
[1] Sobolev Institute of Geology and Mineralogy,
[2] Siberian Branch,undefined
[3] Russian Academy of Sciences,undefined
[4] Budker Institute of Nuclear Physics,undefined
[5] Siberian Branch,undefined
[6] Russian Academy of Sciences,undefined
[7] Center for Collective Use “Siberian Circular Photon Source” (SKIF),undefined
[8] Boreskov Institute of Catalysis,undefined
[9] Siberian Branch,undefined
[10] Russian Academy of Sciences,undefined
[11] Institute of Biophysics,undefined
[12] Siberian Branch,undefined
[13] Russian Academy of Sciences,undefined
来源：
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques | 2023年 / 17卷
关键词：
synchrotron radiation; X-ray fluorescence analysis; tephrochronology;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：1253 / 1257
页数：4
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