High H-atom Density in R(He,Ar)/x%(N2–5%H2) Early Afterglows

被引:0
|
作者
André Ricard
Jayr Amorim
Mustapha Abdeladim
Jean- Philippe Sarrette
机构
[1] Univ. Toulouse,LAPLACE
[2] CNRS,Dept. Fisica
[3] INPT,undefined
[4] UPS,undefined
[5] Inst. Tec. Aeronautica,undefined
[6] CTA,undefined
[7] LMSE,undefined
[8] Fac. Génie Electrique,undefined
[9] USTO,undefined
来源
关键词
R(He,Ar)/N; /H; afterglows; Band intensity ratio method; N and H atoms densities; γ Wall destruction probability of H-atoms on quartz walls;
D O I
暂无
中图分类号
学科分类号
摘要
Absolute densities of N atoms and N2(A) molecules and estimated densities of H atoms and N2(X,v > 13) and NH molecules are determined in R(He,Ar)/x%(N2–5%H2) flowing microwave discharges by a band intensity ratio method after calibration of the N atom density by NO titration. By varying the plasma parameters: pressure of 8 and 4 Torr, flow rates of 0.5, 1.0 and 2.0 slpm, HF power up to 150 W, a high N + N recombination fraction (> 80%) has been observed with He dilution in the early afterglow (t = 5 × 10–3 s). A maximum value of the H-atom density has been found in the He/2%(N2–5%H2) gas mixture at 8 Torr, 0.5 slpm and 150 W, with a [H]/[N] ratio of 0.3. With Ar dilution, it is found that the Ar/5%(N2–5%H2) gas mixture at 4 Torr, 0.5 slpm, 100 W brought a high H2 dissociation (80%), with a [H]/[N] ratio of about 0.6. From the variation of the H-atom density along the quartz tube, the wall destruction probability of the H-atoms was calculated to be γHHe\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${\gamma }_{H}^{He}$$\end{document} = γHAr\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${\gamma }_{H}^{Ar}$$\end{document}  = (1–4) × 10–3 in helium and argon mixtures. Such results are of interest for the enhancement of surface nitriding by the combined effects of N and H atoms inclusion inside a TiO2 surface.
引用
收藏
页码:1351 / 1363
页数:12
相关论文
共 50 条
  • [31] AN EXAMINATION OF THE SITE-SITE REPRESENTATION OF THE HE H2 AND HE N2 POTENTIALS
    HUDSON, B
    MURRELL, JN
    JOURNAL OF MOLECULAR STRUCTURE-THEOCHEM, 1991, 73 : 193 - 211
  • [32] Infrared optical actinometry to determine N- and H-atom density in a N2-H2 microwave discharge
    Mavadat, M.
    Turgeon, S.
    Ricard, A.
    Laroche, G.
    JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2012, 45 (31)
  • [33] Nucleation Rate of N2 and O2 in Cryogenic H2 and He
    Song, Jiaou
    Berry, Joseph D.
    Goudeli, Eirini
    JOURNAL OF PHYSICAL CHEMISTRY B, 2023, 127 (46): : 9976 - 9984
  • [34] EXCITATION OF N2, O2 AND H2 IMPURITIES IN HE, NE AND AR RARE-GASES DISCHARGES
    LEFEBVRE, J
    RICARD, A
    REVUE DE PHYSIQUE APPLIQUEE, 1975, 10 (03): : 137 - 142
  • [35] Surface cleaning and etching of CdZnTe and CdTe in H2/Ar, CH4/H2/Ar, and CH4/H2/N2/Ar electron cyclotron resonance plasmas
    Robert C. Keller
    H. Zimmermann
    M. Seelmann-Eggebert
    H. J. Richter
    Journal of Electronic Materials, 1997, 26 : 542 - 551
  • [36] EXCITATION OF H ATOMS TO S-4 STATE BY 10- TO 35-KEV GROUND-STATE H-ATOM IMPACT ON H2 AND N2
    HUGHES, RH
    JOURNAL OF CHEMICAL PHYSICS, 1972, 57 (10): : 4503 - &
  • [37] MOBILITIES OF RB+ IONS IN HE, NE, AR, H2, N2, O2, AND CO2
    THACKSTON, MG
    ELLIS, HW
    PAI, RY
    MCDANIEL, EW
    JOURNAL OF CHEMICAL PHYSICS, 1976, 65 (05): : 2037 - 2038
  • [38] Gas Solubilities (CO2, O2, Ar, N2, H2, and He) in liquid chlorinated methanes
    Shirono, Katsuhiro
    Morimatsu, Tatsumasa
    Takemura, Fumio
    JOURNAL OF CHEMICAL AND ENGINEERING DATA, 2008, 53 (08): : 1867 - 1871
  • [39] HIGH-TEMPERATURE VIBRATIONAL-RELAXATION OF H2O BY H2O, HE, AR, AND N2
    KUNG, RTV
    CENTER, RE
    JOURNAL OF CHEMICAL PHYSICS, 1975, 62 (06): : 2187 - 2194
  • [40] HIGH-TEMPERATURE VIBRATIONAL-RELAXATION OF H2O BY H2O, HE, AR AND N2
    KUNG, RTV
    CENTER, RE
    BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1975, 20 (03): : 467 - 467